Quantum Well Related Conductivity and Deep Traps in SiGe/Si Structures
Antonova, I.V., Golik, L.L., Kagan, M.S., Polyakov, V.I., Rukavischnikov, A.I., Rossukanyi, N.M., Kolodzey, J.Volume:
108-109
Year:
2005
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.108-109.489
File:
PDF, 321 KB
english, 2005