In Situ Etching of SiC Wafers in a CVD System Using Oxygen as the Source
Wang, Rong Jun, Bhat, I., Chow, T.P.Volume:
389-393
Year:
2002
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.389-393.303
File:
PDF, 316 KB
2002