Electrical and Optical Characterization of Thin...

Solid State Phenomena 2005 Vol. 108-109

Electrical and Optical Characterization of Thin Semiconductor Layers for Advanced ULSI Devices

Simoen, Eddy, Claeys, C., Gaubas, Eugenijus, Rafí, J.M.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
108-109
Year:
2005
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.108-109.539
File:
PDF, 706 KB
english, 2005
Conversion to is in progress
Conversion to is failed