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Raman Stress Characterization of Hetero-Epitaxial 3C-SiC Free Standing Structures
Piluso, Nicolò, Camarda, Massimo, Anzalone, Ruggero, Severino, Andrea, La Magna, Antonino, D'Arrigo, Giuseppe, La Via, FrancescoVolume:
679-680
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.679-680.141
Date:
March, 2011
File:
PDF, 1.04 MB
english, 2011