The NNO Defect in Silicon
Berg Rasmussen, F., Öberg, Sven, Jones, R., Ewels, C.P., Goss, J.P., Miró, J., Deák, PeterVolume:
196-201
Year:
1995
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.196-201.791
File:
PDF, 385 KB
1995