Photoluminescence Study on Point Defects in SIMOX Buried...

Materials Science Forum 1995 Vol. 196-201

Photoluminescence Study on Point Defects in SIMOX Buried SiO2 Film

Seol, K.S., Ieki, A., Ohki, Y., Nishikawa, Hironobu, Tachimori, M.
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Volume:
196-201
Year:
1995
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.196-201.1909
File:
PDF, 355 KB
1995
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