Oscillator Strengths and Linewidths of Shallow Impurity Spectra in Si and Ge
Andreev, Boris A., Kozlov, E.B., Lifshits, T.M.Volume:
196-201
Year:
1995
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.196-201.121
File:
PDF, 366 KB
1995