Measurement for fracture toughness of single crystal...

Measurement for fracture toughness of single crystal silicon film with tensile test

Xueping Li, Takashi Kasai, Shigeki Nakao, Hiroshi Tanaka, Taeko Ando, Mitsuhiro Shikida, Kazuo Sato
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Volume:
119
Year:
2005
Language:
english
Pages:
7
DOI:
10.1016/j.sna.2003.10.063
File:
PDF, 412 KB
english, 2005
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