Measurement for fracture toughness of single crystal silicon film with tensile test
Xueping Li, Takashi Kasai, Shigeki Nakao, Hiroshi Tanaka, Taeko Ando, Mitsuhiro Shikida, Kazuo SatoVolume:
119
Year:
2005
Language:
english
Pages:
7
DOI:
10.1016/j.sna.2003.10.063
File:
PDF, 412 KB
english, 2005