On the Quantification of Al Incorporated in SiC Material...

Materials Science Forum 2011 / 3 Vol. 679-680

On the Quantification of Al Incorporated in SiC Material Using Particle Induced X-Ray Emission Technique

Soueidan, Maher, Nsouli, Bilal, Ferro, Gabriel, Younes, Ghassan
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Volume:
679-680
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.679-680.189
Date:
March, 2011
File:
PDF, 297 KB
english, 2011
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