Study of Electron Irradiation-Induced Defects of 3c-SiC and Diamond by Ultra-High Voltage Electron Microscopy
Oshima, Ryuichiro, Nie, Chou Y., Komatsu, Masao, Mori, HirotaroVolume:
196-201
Year:
1995
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.196-201.1237
File:
PDF, 617 KB
1995