Reduction in threshold voltage fluctuation in...

Reduction in threshold voltage fluctuation in fully-depleted SOI MOSFETs with back gate control

Toshinori Numata, Mitsuhiro Noguchi, Shin-ichi Takagi
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Volume:
48
Year:
2004
Language:
english
Pages:
6
DOI:
10.1016/j.sse.2003.12.018
File:
PDF, 339 KB
english, 2004
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