Reduction in threshold voltage fluctuation in fully-depleted SOI MOSFETs with back gate control
Toshinori Numata, Mitsuhiro Noguchi, Shin-ichi TakagiVolume:
48
Year:
2004
Language:
english
Pages:
6
DOI:
10.1016/j.sse.2003.12.018
File:
PDF, 339 KB
english, 2004