Analysis of heavy-ion induced charge collection mechanisms...

Solid-State Electronics 2004 Vol. 48; Iss. 6

Analysis of heavy-ion induced charge collection mechanisms in SOI circuits

J.R Schwank, V Ferlet-Cavrois, P.E Dodd, M.R Shaneyfelt, G Vizkelethy, P Paillet, O Flament
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Volume:
48
Year:
2004
Language:
english
Pages:
18
DOI:
10.1016/j.sse.2003.12.038
File:
PDF, 1.05 MB
english, 2004
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