A comprehensive geometrical and biasing analysis for...

Solid-State Electronics 2004 Vol. 48; Iss. 12

A comprehensive geometrical and biasing analysis for latchup in 0.18-μm CoSi2 STI CMOS structure

Wang-Ling Goh, Kiat-Seng Yeo
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Volume:
48
Year:
2004
Language:
english
Pages:
6
DOI:
10.1016/j.sse.2004.02.024
File:
PDF, 340 KB
english, 2004
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