High resolution transport spectroscopy in ultimate MOSFETs at very low temperature
M. Sanquer, X. Jehl, M. Specht, G. Bertrand, G. Guégan, S. DeleonibusVolume:
48
Year:
2004
Language:
english
Pages:
5
DOI:
10.1016/j.sse.2004.04.013
File:
PDF, 332 KB
english, 2004