Improved analysis of low frequency noise in polycrystalline...

Improved analysis of low frequency noise in polycrystalline silicon thin-film transistors

D.H. Tassis, N.A. Hastas, C.A. Dimitriadis, G. Kamarinos
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Volume:
49
Year:
2005
Language:
english
Pages:
3
DOI:
10.1016/j.sse.2004.11.023
File:
PDF, 304 KB
english, 2005
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