Improved analysis of low frequency noise in polycrystalline silicon thin-film transistors
D.H. Tassis, N.A. Hastas, C.A. Dimitriadis, G. KamarinosVolume:
49
Year:
2005
Language:
english
Pages:
3
DOI:
10.1016/j.sse.2004.11.023
File:
PDF, 304 KB
english, 2005