An accurate, analytical, and technology-mapped definition...

Solid-State Electronics 2006 Vol. 50; Iss. 11-12

An accurate, analytical, and technology-mapped definition of the surface potential at threshold and a new postulate for the threshold voltage of MOSFETs

Vaskar Sarkar, Aloke K. Dutta
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Volume:
50
Year:
2006
Language:
english
Pages:
8
DOI:
10.1016/j.sse.2006.09.015
File:
PDF, 396 KB
english, 2006
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