Investigation of EMI-induced noise spectrum in an...

Investigation of EMI-induced noise spectrum in an enhancement-type MOSFET

Han-Chang Tsai, Kuo-Chang Wang
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Volume:
52
Year:
2008
Language:
english
Pages:
10
DOI:
10.1016/j.sse.2008.05.006
File:
PDF, 331 KB
english, 2008
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