Volume 52; Issue 8

Solid-State Electronics

Volume 52; Issue 8
1

Electrical properties of Π-conjugated Fe-TPP molecular solar cell device

Year:
2008
Language:
english
File:
PDF, 154 KB
english, 2008
3

Characterization of poly-Si TFT variation using interdigitated method

Year:
2008
Language:
english
File:
PDF, 1.06 MB
english, 2008
5

Impact strain engineering on gate stack quality and reliability

Year:
2008
Language:
english
File:
PDF, 475 KB
english, 2008
6

Possible new mechanism of chip latent damage due to ESD

Year:
2008
Language:
english
File:
PDF, 456 KB
english, 2008
11

Investigation of EMI-induced noise spectrum in an enhancement-type MOSFET

Year:
2008
Language:
english
File:
PDF, 331 KB
english, 2008
16

Investigation of 65 nm CMOS transistor local variation using a FET array

Year:
2008
Language:
english
File:
PDF, 208 KB
english, 2008
17

Thermal stability of C-doped GaAs/AlAs DBR structures

Year:
2008
Language:
english
File:
PDF, 785 KB
english, 2008
18

Editorial Board

Year:
2008
Language:
english
File:
PDF, 183 KB
english, 2008
21

T-shaped shallow trench isolation with unfilled floating void

Year:
2008
Language:
english
File:
PDF, 508 KB
english, 2008
22

ESD protection design for I/O libraries in advanced CMOS technologies

Year:
2008
Language:
english
File:
PDF, 1.34 MB
english, 2008