Investigation of 65 nm CMOS transistor local...

Solid-State Electronics 2008 Vol. 52; Iss. 8

Investigation of 65 nm CMOS transistor local variation using a FET array

Y.Z. Xu, C.S. Chen, J.T. Watt
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
52
Year:
2008
Language:
english
Pages:
5
DOI:
10.1016/j.sse.2008.06.002
File:
PDF, 208 KB
english, 2008
Conversion to is in progress
Conversion to is failed