![](/img/cover-not-exists.png)
Determination of electron effective mass and electron affinity in HfO2 using MOS and MOSFET structures
S. Monaghan, P.K. Hurley, K. Cherkaoui, M.A. Negara, A. SchenkVolume:
53
Year:
2009
Language:
english
Pages:
7
DOI:
10.1016/j.sse.2008.09.018
File:
PDF, 827 KB
english, 2009