Measurement of the MOSFET drain current variation under...

Solid-State Electronics 2009 Vol. 53; Iss. 3

Measurement of the MOSFET drain current variation under high gate voltage

Kazuo Terada, Tetsuo Chagawa, Jianyu Xiang, Katsuhiro Tsuji, Takaaki Tsunomura, Akio Nishida
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Volume:
53
Year:
2009
Language:
english
Pages:
6
DOI:
10.1016/j.sse.2008.12.007
File:
PDF, 717 KB
english, 2009
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