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Simulation of hole and electron tunnel currents in MIS devices adopting the symmetric Franz-type dispersion relation for the charged carriers in thin insulators
M.I. Vexler, A. Kuligk, B. MeinerzhagenVolume:
53
Year:
2009
Language:
english
Pages:
7
DOI:
10.1016/j.sse.2009.01.014
File:
PDF, 612 KB
english, 2009