Characterization of flatband voltage roll-off and roll-up behavior in La2O3/silicate gate dielectric
K. Kakushima, T. Koyanagi, K. Tachi, J. Song, P. Ahmet, K. Tsutsui, N. Sugii, T. Hattori, H. IwaiVolume:
54
Year:
2010
Language:
english
Pages:
4
DOI:
10.1016/j.sse.2010.03.007
File:
PDF, 333 KB
english, 2010