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Retention modeling of nanocrystalline flash memories: A Monte Carlo approach
Bahniman Ghosh, Hai Liu, Brian Winstead, Mark C. Foisy, Sanjay K. BanerjeeVolume:
54
Year:
2010
Language:
english
Pages:
5
DOI:
10.1016/j.sse.2010.04.005
File:
PDF, 413 KB
english, 2010