Characterization of Electron Traps in n-InP Induced by Hydrogen Plasma
Sakamoto, Yoshifumi, Sugino, Takashi, Matsuda, Koichiro, Shirafuji, JunjiVolume:
196-201
Year:
1995
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.196-201.1973
File:
PDF, 410 KB
1995