Characterization of Electron Traps in n-InP Induced by...

Characterization of Electron Traps in n-InP Induced by Hydrogen Plasma

Sakamoto, Yoshifumi, Sugino, Takashi, Matsuda, Koichiro, Shirafuji, Junji
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Volume:
196-201
Year:
1995
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.196-201.1973
File:
PDF, 410 KB
1995
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