Atomic-Scale Studies of Point Defects in Compound Semiconductors by Scannig Tunneling Microscopy
Gwo, S., Miwa, S., Ohno, H., Fan, Jun Fei, Tokumoto, H.Volume:
196-201
Year:
1995
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.196-201.1949
File:
PDF, 371 KB
1995