Complete Determination of the Local Stress Field in Epitaxial Thin Films Using Single Microstructure
Camarda, Massimo, Anzalone, Ruggero, Severino, Andrea, Piluso, Nicolò, La Magna, Antonino, La Via, FrancescoVolume:
679-680
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.679-680.213
Date:
March, 2011
File:
PDF, 1.55 MB
english, 2011