Minority Carrier Diffusion Length in AlGaN: A Combined Electron Beam Induced Current and Transmission Microscopy Study
Cremades, A., Albrecht, M., Voigt, Axel, Krinke, J., Dimitrov, R., Ambacher, Oliver, Stutzmann, M.Volume:
63-64
Year:
1998
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.63-64.139
File:
PDF, 574 KB
english, 1998