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Volume 63-64
Main
Solid State Phenomena
Volume 63-64
Solid State Phenomena
Volume 63-64
1
Ion Beam Induced Luminescence
Malmqvist, K.G.
Journal:
Solid State Phenomena
Year:
1998
File:
PDF, 246 KB
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1998
2
Gate Oxide Defect Analysis Using Scanning Electron Microscopy (SEM)/Metal Oxide Semiconductor (MOS)/Electron Beam Induced Current (EBIC) with Sub-Nano Ampere Current Breakdown
Tamatsuka, M.
,
Miki, K.
Journal:
Solid State Phenomena
Year:
1998
Language:
english
File:
PDF, 1.13 MB
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english, 1998
3
SEM-EBIC Study of Defects in Epitaxial AlGaN Layers
Panin, G.N.
,
Kononenko, O.V.
,
Matveev, V.N.
,
Yakimov, E.B.
,
Ambacher, Oliver
Journal:
Solid State Phenomena
Year:
1998
File:
PDF, 468 KB
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1998
4
Correlative SEM/STM Study of Local Electronic Properties in Compound Semiconductors
Piqueras, J.
,
Panin, G.N.
,
Díaz-Guerra, C.
,
Hidalgo, P.
,
Méndez, B.
Journal:
Solid State Phenomena
Year:
1998
Language:
english
File:
PDF, 910 KB
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english, 1998
5
Minority Carrier Transient Spectroscopy of Copper-Silicide and Nickel-Disilicide Precipitates in Silicon
Vyvenko, O.F.
Journal:
Solid State Phenomena
Year:
1998
Language:
english
File:
PDF, 604 KB
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english, 1998
6
Laser Induced Mapping for Separation of Bulk and Surface Recombination
Ostendorf, H.-C.
,
Endrös, A.L.
Journal:
Solid State Phenomena
Year:
1998
Language:
english
File:
PDF, 764 KB
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english, 1998
7
The Assessment of Micro-Analytical Techniques to the Semiconductor Manufacturing Environment
Corbacho, J.L
,
Urquía, A.
,
Fernández, Asunción
,
Sánchez, G.
,
Recio, M.
,
Martín, V.
,
Barbado, F.
,
Morilla, C.
,
Riloba, A.
,
de la Hoz, J. M.
Journal:
Solid State Phenomena
Year:
1998
Language:
english
File:
PDF, 1009 KB
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english, 1998
8
Spatially Resolved Cathodoluminescence Study on CVD Homoepitaxial Diamond Film
Watanabe, H.
,
Takeuchi, Daisuke
,
Okushi, Hideyo
,
Kajimura, K.
,
Sekiguchi, Takashi
Journal:
Solid State Phenomena
Year:
1998
File:
PDF, 486 KB
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1998
9
Cathodoluminescence and Photoluminescence Characterisation of Etched Mesas of ZnTe/ZnMgTe Quantum Wells under Tensile Strain
Dassonneville, S.
,
Niquet, Y.-M.
,
Sieber, B.
,
Mariette, H.
Journal:
Solid State Phenomena
Year:
1998
File:
PDF, 448 KB
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1998
10
Application of Small Pulsed Ion Beams for Depth Profiling on Beveled Semiconductor Structures
Krüger, D.
,
Iltgen, K.
,
Kurps, R.
Journal:
Solid State Phenomena
Year:
1998
File:
PDF, 584 KB
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1998
11
Two Dimensional Mapping of pn Junctions by Electron Holography
Rau, W.D.
,
Schwander, P.
,
Ourmazd, A.
Journal:
Solid State Phenomena
Year:
1998
File:
PDF, 334 KB
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1998
12
Nanocharacterization of Semiconductors by Scanning Photoluminescence Microscopy
Fischer, P.
,
Christen, J.
,
Zacharias, M.
,
Nakashima, H.
,
Hiramatsu, K.
Journal:
Solid State Phenomena
Year:
1998
File:
PDF, 627 KB
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1998
13
Cathodoluminescence Dependence on Beam Generation Conditions and Surface Properties of Materials
Achour, S.
,
Belahrache, M.T.
,
Harabi, Abdelhamid
,
Tabet, N.
Journal:
Solid State Phenomena
Year:
1998
Language:
english
File:
PDF, 410 KB
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english, 1998
14
Effect of Erbidum on the Luminescence Properties of GaSb Crystals
Hidalgo, P.
,
Méndez, B.
,
Piqueras, J.
,
Plaza, J.
,
Diéguez, E.
Journal:
Solid State Phenomena
Year:
1998
File:
PDF, 578 KB
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1998
15
Determination of the Surface Recombination Velocity and of Its Evolution in Monocrystalline Silicon by the Light Beam Induced Current Technique in Planar Configuration
Spadoni, S.
,
Acciarri, Maurizio
,
Barbi, G.
,
Pizzini, Sergio
Journal:
Solid State Phenomena
Year:
1998
Language:
english
File:
PDF, 428 KB
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english, 1998
16
Cathodoluminescence Investigation of Diffusion Studies on the Arsenic Sublattice in Gallium Arsenide
Scholz, R.F.
,
Gösele, U.M.
,
Breitenstein, O.
,
Egger, U.
,
Tan, T.Y.
Journal:
Solid State Phenomena
Year:
1998
Language:
english
File:
PDF, 565 KB
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english, 1998
17
Characterization of Laser-Irradiated CdxHg1-xTe Solid Solutions by Scanning Microscopy Method
Gnatyuk, V.A.
Journal:
Solid State Phenomena
Year:
1998
File:
PDF, 601 KB
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1998
18
Cathodoluminescence Study of Heavily Proton Irradiated Heteroepitaxial n+-p InP/Si Solar Cells
Romero, M.
,
Walters, R.J.
,
Araújo, Daniel
,
García, R.
Journal:
Solid State Phenomena
Year:
1998
Language:
english
File:
PDF, 426 KB
Your tags:
english, 1998
19
Neat Field Optics: Comeback of Light in Microscopy
Pohl, D.W.
Journal:
Solid State Phenomena
Year:
1998
File:
PDF, 454 KB
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1998
20
Local Stress, Surface Reconstruction, and Bulk Defect Nucleation: An STM Study on Silicon
Müssig, Hans Joachim
,
Dąbrowski, Jaroslaw
Journal:
Solid State Phenomena
Year:
1998
Language:
english
File:
PDF, 927 KB
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english, 1998
21
Cathodoluminescence Study on ZnO and GaN
Sekiguchi, Takashi
,
Ohashi, Naoki
,
Yamane, Hisanori
Journal:
Solid State Phenomena
Year:
1998
Language:
english
File:
PDF, 739 KB
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english, 1998
22
Defect Characterization in Metal-Oxide-Semiconductor Field-Effect-Transistors with Trench Gates by Electron Beam-Induced Current Technique
Tomokage, H.
,
Ishiwata, Y.
,
Souno, H.
,
Kawakami, Masahiro
,
Sonoda, N.
Journal:
Solid State Phenomena
Year:
1998
File:
PDF, 733 KB
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1998
23
Correlation of Cathodoluminescence and EBIC Contrast in GaAs/AlxGa1-xAs Quantum Well Structures
Jahn, U.
,
Hey, R.
,
Kostial, H.
,
Grahn, H.T.
Journal:
Solid State Phenomena
Year:
1998
Language:
english
File:
PDF, 557 KB
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english, 1998
24
Near-Field Cathodoluminescence (NF-CL) Investigations on Semiconducting Materials
Ebinghaus, V.
,
Cramer, R.M.
,
Heiderhoff, R.
,
Balk, L.J.
Journal:
Solid State Phenomena
Year:
1998
File:
PDF, 362 KB
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1998
25
Impact of Phosphorus Diffusion on the Contamination Level of Dislocations in Deformed Float Zone Silicon as Studied by Beam Injection Techniques
Knobloch, K.
,
Kittler, Martin
,
Seifert, Winfried
,
Simon, J.J.
,
Périchaud, Isabelle
Journal:
Solid State Phenomena
Year:
1998
Language:
english
File:
PDF, 594 KB
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english, 1998
26
Scanning Acoustic Microscopes for the Investigation of Ferroelectric Properties of Materials
Liu, Xing Gang
,
Balk, L.J.
,
Shafirstein, G.
,
Eckau, A.
,
Yin, Qing Rui
Journal:
Solid State Phenomena
Year:
1998
File:
PDF, 713 KB
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1998
27
Analysis of Non-Uniform Contamination Profiles by Lifetime Data
Polignano, Maria Luisa
,
Caputo, Domenico
,
Pavia, G.
,
Zanderigo, F.
Journal:
Solid State Phenomena
Year:
1998
File:
PDF, 649 KB
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1998
28
Failure Analysis of Neutron-Irradiated MQW InGaAsP/InP Lasers by EBIC
Romero, M.
,
Araújo, Daniel
,
Gill, K.
,
Vasey, F.
,
García, R.
Journal:
Solid State Phenomena
Year:
1998
Language:
english
File:
PDF, 503 KB
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english, 1998
29
Monte Carlo Simulation of the Recombination Contrast of Dislocations
Tabet, N.
Journal:
Solid State Phenomena
Year:
1998
File:
PDF, 371 KB
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1998
30
The Sloc Positron Beam Technique – A Unique Tool for the Study of Vacancy-Type Defects in Semiconductors
Krause-Rehberg, R.
,
Eichler, S.
,
Gebauer, J.
,
Börner, F.
Journal:
Solid State Phenomena
Year:
1998
Language:
english
File:
PDF, 693 KB
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english, 1998
31
The Spatial Distribution of Modulated CL Signal in Inhomogeneous Semiconductors with Large Diffusion Length
Kireev, V.A.
,
Razgonov, I.I.
,
Yakimov, E.B.
Journal:
Solid State Phenomena
Year:
1998
Language:
english
File:
PDF, 571 KB
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english, 1998
32
Minority Carrier Diffusion Length in AlGaN: A Combined Electron Beam Induced Current and Transmission Microscopy Study
Cremades, A.
,
Albrecht, M.
,
Voigt, Axel
,
Krinke, J.
,
Dimitrov, R.
,
Ambacher, Oliver
,
Stutzmann, M.
Journal:
Solid State Phenomena
Year:
1998
Language:
english
File:
PDF, 574 KB
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english, 1998
33
Direct Imaging of the Crystalline and Chemical Nanostructure of GA,IN-Nitrides by Highly Spatially-, Spectrally- and Time-Resolved Cathodoluminescence
Rudloff, D.
,
Bertram, F.
,
Riemann, T.
,
Christen, J.
,
Böttcher, T.
,
Selke, H.
,
Hommel, D.
,
Hiramatsu, K.
Journal:
Solid State Phenomena
Year:
1998
Language:
english
File:
PDF, 657 KB
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english, 1998
34
Scanning Photoluminescence for Wafer Characterization
Higgs, V.
,
Chin, F.
,
Wang, Xue Cheng
Journal:
Solid State Phenomena
Year:
1998
Language:
english
File:
PDF, 1.02 MB
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english, 1998
35
Fabrication and Ellipsometric Investigation of Thin Films of Rare-Earth Oxides
Fursenko, O.V.
,
Semikina, T.V.
,
Shmyrjeva, A.N.
Journal:
Solid State Phenomena
Year:
1998
File:
PDF, 382 KB
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1998
36
EBIC Study of Field Effect Transistors on Modulation-Doped AlGaAs/lnGaAs/GaAs Heterostructures
Sieber, B.
,
Farvacque, J.-L.
Journal:
Solid State Phenomena
Year:
1998
Language:
english
File:
PDF, 686 KB
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english, 1998
37
Lateral Doping Inhomogeneities as Revealed by μ-NEXAFS and μ-PES
Mikalo, R.P.
,
Hoffmann, P.
,
Heller, Th.
,
Schmeißer, D.
Journal:
Solid State Phenomena
Year:
1998
Language:
english
File:
PDF, 622 KB
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english, 1998
38
Stress Measurements in sub-μm Si Structures Using Raman Spectroscopy
Dombrowski, K.F.
,
De Wolf, I.
Journal:
Solid State Phenomena
Year:
1998
File:
PDF, 410 KB
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1998
39
Evaluation of p-n Junction Position and Channel Length in Si Devices with Resolution of a Few Nanometers by Low-Energy EBIC
Kittler, Martin
,
Lärz, J.
Journal:
Solid State Phenomena
Year:
1998
Language:
english
File:
PDF, 502 KB
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english, 1998
40
EBIC of Strained Si/SiGe 2DEGs Showing Lateral Electron Confinement
Norman, Carl E.
,
Griffin, N.
,
Arnone, D.D.
,
Paul, D.J.
,
Pepper, M.
,
Gallas, B.
,
Fernández, J.M.
Journal:
Solid State Phenomena
Year:
1998
File:
PDF, 559 KB
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1998
41
Cathodoluminescence from Nanocrystalline Silicon Films in the Scanning Electron Microscope
Méndez, B.
,
Piqueras, J.
,
Plugaru, R.
,
Craciun, G.
,
Nastase, N.
,
Cremades, A.
,
Nogales, E.
Journal:
Solid State Phenomena
Year:
1998
File:
PDF, 435 KB
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1998
42
Application of Surface Electron Beam Induced Voltage Method for the Contactless Characterization of Semiconductor Structures
Rau, E.I.
,
Zhukov, A.N.
,
Yakimov, E.B.
Journal:
Solid State Phenomena
Year:
1998
File:
PDF, 497 KB
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1998
43
Failure Mode Analysis of a 0.25 μm CMOS Technology by Scanning Electron and Ion Beams
Krüger, D.
,
Rosenkranz, R.
,
Tippelt, B.
,
Kuhnert, M.
,
Grießbach, K.
,
Lamprecht, A.
,
Hennecke, S.
Journal:
Solid State Phenomena
Year:
1998
Language:
english
File:
PDF, 1.14 MB
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english, 1998
44
Analysis of Minority Carrier Diffusion in the Presence of a Dislocation Array: Effective Diffusion Length, Luminescence Efficiency and Dark Current
Donolato, C.
Journal:
Solid State Phenomena
Year:
1998
Language:
english
File:
PDF, 446 KB
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english, 1998
45
Grain Growth of ZnSe Recrystallized in the Solid Phase
Fusil, S.
,
Zozime, A.
,
Pénelle, R.
,
Grillon, F.
,
Le Paven, C.
,
Rivière, Andre
,
Triboulet, R.
Journal:
Solid State Phenomena
Year:
1998
File:
PDF, 456 KB
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1998
46
Electrical Properties of SiGe Epitaxial Layers for Photovoltaic Application as Studied by Scanning Electron Microscopical Methods
Krüger, O.
,
Seifert, Winfried
,
Kittler, Martin
,
Gutjahr, A.
,
Konuma, M.
,
Said, K.
,
Poortmans, J.
Journal:
Solid State Phenomena
Year:
1998
Language:
english
File:
PDF, 902 KB
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english, 1998
47
Cathodoluminescence Study of Defect Distribution at Different Depths in Films SiO2/Si
Zamoryanskaya, M.V.
,
Sokolov, V.I.
,
Sitnikova, A.A.
,
Konnikov, S.G.
Journal:
Solid State Phenomena
Year:
1998
File:
PDF, 351 KB
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1998
48
Observation and Modelization of the Electrostatic Force due to the Local Variations of the Surface Potential by Electrostatic Force Microscopy (EFM)
Bresse, J.F.
Journal:
Solid State Phenomena
Year:
1998
Language:
english
File:
PDF, 335 KB
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english, 1998
49
Cathodoluminescence Microscopy of Semiconductor Devices Using a Novel Detector with High Collection and Backscattered Electron Rejection Efficiency
Phang, Jacob C.H.
,
Chan, Daniel S.H.
,
Chim, W.K.
,
Liu, Yan Yi
,
Liu, X.
Journal:
Solid State Phenomena
Year:
1998
Language:
english
File:
PDF, 703 KB
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english, 1998
50
LBIC Investigations of the Lifetime Degradation by Extended Defects in Multicrystalline Solar Silicon
Rinio, Markus
,
Möller, Hans Joachim
,
Werner, Martina
Journal:
Solid State Phenomena
Year:
1998
Language:
english
File:
PDF, 1.18 MB
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english, 1998
51
Combined MOS/EBIC and Tem Study of Electrically Active Defects in SOI Wafers
Kononchuk, O.V.
,
Bondarenko, I.E.
,
Rozgonyi, George A.
Journal:
Solid State Phenomena
Year:
1998
File:
PDF, 494 KB
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1998
52
TEM and Photoluminescence Investigations of InGaAs/GaAs Quantum Well Layers
Frigeri, C.
,
Brinciotti, A.
,
Ritchie, D.M.
,
Di Paola, A.
Journal:
Solid State Phenomena
Year:
1998
File:
PDF, 920 KB
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1998
53
The Nature of the Electronic States of Cu3Si-Precipitates in Silicon
Sattler, Andreas
,
Hedemann, Henrik
,
Istratov, Andrei A.
,
Seibt, Michael
,
Schröter, Wolfgang
Journal:
Solid State Phenomena
Year:
1998
File:
PDF, 448 KB
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1998
54
Detection and Characterisation of 'Sleeping' Defects in Silicon by LBIC Scan Maps at 80 K.
Martinuzzi, Santo
,
Périchaud, Isabelle
,
McHugo, Scott A.
Journal:
Solid State Phenomena
Year:
1998
File:
PDF, 830 KB
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1998
55
Characterization of Laser Structures by EBIC Measurements and Simulation
Rechenberg, I.
,
Wenzel, H.
,
Knauer, A.
,
Beister, G.
Journal:
Solid State Phenomena
Year:
1998
File:
PDF, 579 KB
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1998
56
The Future of Beam Injection Techniques: Summary of the Round-Table Discussion Held at BIADS 98
Endrös, A.
,
Jakubowicz, A.
,
Radzimski, Zbigniew J.
Journal:
Solid State Phenomena
Year:
1998
File:
PDF, 187 KB
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1998
57
EBIC Characterization of Oxygen Precipitation and Denuded Zone in Intrinsically Gettered P-Type Czochralski Silicon
Spiga, S.
,
Castaldini, Antonio
,
Cavallini, Anna
,
Polignano, Maria Luisa
,
Cazzaniga, F.
Journal:
Solid State Phenomena
Year:
1998
Language:
english
File:
PDF, 633 KB
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english, 1998
58
Charge Collection Scanning Microscopy: Non-Conventional Applications
Castaldini, Antonio
,
Cavallini, Anna
Journal:
Solid State Phenomena
Year:
1998
Language:
english
File:
PDF, 928 KB
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english, 1998
59
Modification of Electronical and Optical Properties in SiO2 Films by Electron Beam Irradiation
Fitting, H.-J.
,
von Czarnowski, A.
,
Trukhin, A.N.
,
Goldberg, M.
,
Barfels, T.
Journal:
Solid State Phenomena
Year:
1998
File:
PDF, 437 KB
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1998
60
Non-Destructive Investigations of Co and CoSi2-x Films on Si Substrate
Dmitruk, N.L.
,
Fursenko, O.V.
,
Medvid, Arthur
,
Knight, D.
,
Grigonis, A.
Journal:
Solid State Phenomena
Year:
1998
File:
PDF, 344 KB
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1998
61
Inline Analysis of Defects in Microelectronic Fabrication by Optical and Scanning Electron Microscopical Techniques
Morilla, C.
,
Kittler, Martin
Journal:
Solid State Phenomena
Year:
1998
Language:
english
File:
PDF, 735 KB
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english, 1998
62
Effect of Plastic Deformation on the Luminescence of ZnSe Crystals
Fernández, P.
,
Piqueras, J.
,
Urbieta, A.
,
Rebane, Y.T.
,
Shreter, Y.
Journal:
Solid State Phenomena
Year:
1998
File:
PDF, 374 KB
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1998
63
EBIC and Cathodoluminescence Study of the Bonded Silicon Wafers
Ikeda, Kenichi
,
Sekiguchi, Takashi
,
Ito, Syouko
,
Suezawa, Masashi
Journal:
Solid State Phenomena
Year:
1998
File:
PDF, 683 KB
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1998
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