EBIC and DLTS Study of Deformation Induced Defect Thermal...

Solid State Phenomena 2005 Vol. 108-109

EBIC and DLTS Study of Deformation Induced Defect Thermal Stability in n-Si

Feklisova, O.V., Yakimov, E.B.
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Volume:
108-109
Year:
2005
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.108-109.567
File:
PDF, 1.44 MB
english, 2005
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