The Impact of Backside Particles on the Limits of Optical Lithography
Bearda, Twan, Mertens, Paul W., Holsteyns, Frank, De Bisschop, Peter, Compen, René, van Meer, Aschwin, Heyns, Marc M.Volume:
103-104
Year:
2005
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.103-104.129
File:
PDF, 502 KB
english, 2005