![](/img/cover-not-exists.png)
Defect Formation and Recombination Processes in p-Type Modulation-Doped Si Epilayers
Buyanova, I.A., Chen, W.M., Henry, Anne, Ni, W.X., Hansson, G.V., Monemar, BoVolume:
196-201
Year:
1995
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.196-201.479
File:
PDF, 401 KB
1995