The Employment of Cathodoluminescent Method for Characterization of Silicon Oxide - Silicon Interface
Zamoryanskaya, M.V., Sokolov, V.I.Volume:
108-109
Year:
2005
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.108-109.649
File:
PDF, 287 KB
english, 2005