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A new measurement technique for the characterization of carrier lifetime in thin SOI MOSFETs
Yoshikata Nakajima, Hideki Tomita, Kenichi Aoto, Kenji Sasaki, Tatsuro Hanajiri, Toru Toyabe, Takitaro Morikawa, Takuo SuganoVolume:
462-463
Year:
2004
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2004.05.016
File:
PDF, 461 KB
english, 2004