Determination of band offsets in strained-Si heterolayers

C.K. Maiti, S.K. Samanta, S. Chatterjee, G.K. Dalapati, S. Bhattacharya, B.M. Armstrong, H.S. Gamble, J. McCarthy, T.S. Perova, R.A. Moore

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Volume:

462-463

Year:

2004

Language:

english

Pages:

DOI:

10.1016/j.tsf.2004.05.026

File:

PDF, 201 KB

english, 2004

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