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Determination of band offsets in strained-Si heterolayers
C.K. Maiti, S.K. Samanta, S. Chatterjee, G.K. Dalapati, S. Bhattacharya, B.M. Armstrong, H.S. Gamble, J. McCarthy, T.S. Perova, R.A. MooreVolume:
462-463
Year:
2004
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2004.05.026
File:
PDF, 201 KB
english, 2004