Defect Induced Electron Transport Trough Semiconductor...

Defect Induced Electron Transport Trough Semiconductor Barriers

Bourgoin, J.C., El Mir, Lassad
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Volume:
196-201
Year:
1995
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.196-201.437
File:
PDF, 317 KB
1995
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