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Characterization of hot-carrier degraded SiGe/Si-hetero-PMOSFETs
Toshiaki Tsuchiya, Masao Sakuraba, Junichi MurotaVolume:
508
Year:
2006
Language:
english
Pages:
3
DOI:
10.1016/j.tsf.2005.07.320
File:
PDF, 183 KB
english, 2006