Fabrication and characterization of strained Si1−yCy...

Thin Solid Films 2006 Vol. 508; Iss. 1-2

Fabrication and characterization of strained Si1−yCy n-MOSFETs grown by Hot Wire Cell method

Hanae Ishihara, Tatsuro Watahiki, Akira Yamada, Makoto Konagai
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
508
Year:
2006
Language:
english
Pages:
4
DOI:
10.1016/j.tsf.2005.07.337
File:
PDF, 177 KB
english, 2006
Conversion to is in progress
Conversion to is failed