Structural and electrical evaluation for strained Si/SiGe...

Structural and electrical evaluation for strained Si/SiGe on insulator

Dong Wang, Seiichiro Ii, Ken-ichi Ikeda, Hideharu Nakashima, Masaharu Ninomiya, Masahiko Nakamae, Hiroshi Nakashima
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
508
Year:
2006
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2005.07.338
File:
PDF, 289 KB
english, 2006
Conversion to is in progress
Conversion to is failed