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In situ characterization of the heterointerfaces between SrO films and dangling-bond-terminated Si surfaces
H. Asaoka, T. Yamazaki, H. Yamamoto, S. ShamotoVolume:
508
Year:
2006
Language:
english
Pages:
3
DOI:
10.1016/j.tsf.2005.08.413
File:
PDF, 161 KB
english, 2006