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Investigation of nanocrystalline Epi-Si/γ-Al2O3 heterostructure deposited on Si substrate by spectroscopic ellipsometry
Mosammat Halima Khatun, Mohammad Shahjahan, Ryoki Ito, Kazuaki Sawada, Makoto IshidaVolume:
508
Year:
2006
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2005.09.195
File:
PDF, 210 KB
english, 2006