Wet Preparation of Defect-Free Hydrogen-Terminated Silicon Wafer Surface and Its Characterization in Atomic-Scale
Takahagi, Takayuki, Shingubara, Shozo, Sakaue, HiroyukiVolume:
76-77
Year:
2001
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.76-77.105
File:
PDF, 568 KB
2001