The international VAMAS project on X-ray reflectivity...

Thin Solid Films 2008 Vol. 516; Iss. 22

The international VAMAS project on X-ray reflectivity measurements for evaluation of thin films and multilayers — Preliminary results from the second round-robin

R.J. Matyi, L.E. Depero, E. Bontempi, P. Colombi, A. Gibaud, M. Jergel, M. Krumrey, T.A. Lafford, A. Lamperti, M. Meduna, A. Van der Lee, C. Wiemer
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Volume:
516
Year:
2008
Language:
english
Pages:
5
DOI:
10.1016/j.tsf.2008.04.004
File:
PDF, 545 KB
english, 2008
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