Volume 516; Issue 22

Main
Thin Solid Films
Volume 516; Issue 22

Thin Solid Films

Volume 516; Issue 22

1

The international VAMAS project on X-ray reflectivity measurements for evaluation of thin films and multilayers — Preliminary results from the second round-robin

R.J. Matyi, L.E. Depero, E. Bontempi, P. Colombi, A. Gibaud, M. Jergel, M. Krumrey, T.A. Lafford, A. Lamperti, M. Meduna, A. Van der Lee, C. Wiemer

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 545 KB

english, 2008

2

Thickness determination of SrZrO3 thin films using both X-ray reflectometry and SIMS techniques

K. Galicka-Fau, C. Legros, M. Andrieux, M. Herbst-Ghysel, I. Gallet, M. Condat, O. Durand, B. Servet

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 960 KB

english, 2008

3

Investigation of lanthanum and hafnium-based dielectric films by X-ray reflectivity, spectroscopic ellipsometry and X-ray photoelectron spectroscopy

V. Edon, M.-C. Hugon, B. Agius, O. Durand, C. Eypert, C. Cardinaud

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 790 KB

english, 2008

4

Optical characterization of HfO2 by spectroscopic ellipsometry: Dispersion models and direct data inversion

Jordi Sancho-Parramon, Mircea Modreanu, Salvador Bosch, Michel Stchakovsky

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 366 KB

english, 2008

5

Structural characterization of self-assembled semiconductor islands by three-dimensional X-ray diffraction mapping in reciprocal space

V. Holý, K. Mundboth, C. Mokuta, T.H. Metzger, J. Stangl, G. Bauer, T. Boeck, M. Schmidbauer

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 895 KB

english, 2008

6

Depth-resolved strain measurements in polycrystalline multilayers by energy-variable X-ray diffraction

Emil Zolotoyabko

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 322 KB

english, 2008

7

Determination of the fundamental and spin-orbit-splitting band gap energies of InAsSb-based ternary and pentenary alloys using mid-infrared photoreflectance

S.A. Cripps, T.J.C. Hosea, A. Krier, V. Smirnov, P.J. Batty, Q.D. Zhuang, H.H. Lin, Po-Wei Liu, G. Tsai

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 1.19 MB

english, 2008

8

Sub-pixel detection of a grid's node positions for optical diagnostics

I.E. Lukács, Ferenc Riesz

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 718 KB

english, 2008

9

Makyoh-topography study of the swirl defect in Si wafers

Ferenc Riesz, A.E. Pap, M. Ádám, I.E. Lukács

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 836 KB

english, 2008

10

Influence of the GaAs substrate orientation on the composition of GaxIn1 − xP (x ≈ 0.5) grown by LPE and MOCVD

V.A. Mishurnyi, F. de Anda, A.Yu. Gorbatchev, Yu. Kudriavtsev, V.A. Elyukhin, T. Prutskij, C. Pelosi, C. Bocchi, B.Y. Ber, F.E. Ortiz Vazquez

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 288 KB

english, 2008

11

X-ray diffraction peak profile analysis aiming at better understanding of the deformation process and deformed structure of a martensitic steel

M.R. Movaghar Garabagh, S. Hossein Nedjad, H. Shirazi, M. Iranpour Mobarekeh, M. Nili Ahmadabadi

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 1.04 MB

english, 2008

12

Defects in Cu2O, CuAlO2 and SrCu2O2 transparent conducting oxides

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 659 KB

english, 2008

13

An RBS study of thin PLD and MOCVD strontium copper oxide layers

Z. Kántor, E.L. Papadopoulou, E. Aperathitis, J.-L. Deschanvres, K. Somogyi, I. Szendrő

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 520 KB

english, 2008

14

Optical properties of zinc nitride thin films fabricated by rf-sputtering from ZnN target

P. Voulgaropoulou, S. Dounis, V. Kambilafka, M. Androulidaki, M. Ružinský, V. Šály, P. Prokein, Z. Viskadourakis, K. Tsagaraki, E. Aperathitis

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 1003 KB

english, 2008

15

Photoelectrochemical studies of semiconducting photoanodes for hydrogen production via water dissociation

I.E. Paulauskas, J.E. Katz, G.E. Jellison Jr., N.S. Lewis, L.A. Boatner

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 367 KB

english, 2008

16

Investigation on the nitrogen doping of multilayered, porous TiO2 thin films

M. Gartner, P. Osiceanu, M. Anastasescu, T. Stoica, T.F. Stoica, C. Trapalis, T. Giannakopoulou, N. Todorova, A. Lagoyannis

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 861 KB

english, 2008

17

Lifetime improvement of organic light-emitting diodes using silicon oxy-nitride as anode modifier

F.L. Wong, M.Y. Chan, S.L. Lai, M.K. Fung, K.H. Lai, W.M. Tsang, T.W. Ng, C.O Poon, C.S. Lee, S.T. Lee

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 274 KB

english, 2008

18

Electrical conduction and dielectric relaxation of a-SiOx (0 

Nicolae Tomozeiu

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 547 KB

english, 2008

19

Ceramic materials Ba(1 − x)SrxTiO3 for electronics — Synthesis and characterization

C. Berbecaru, H.V. Alexandru, C. Porosnicu, A. Velea, A. Ioachim, L. Nedelcu, M. Toacsan

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 2.11 MB

english, 2008

20

Editorial

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 91 KB

english, 2008

21

Optical properties of nanocrystalline titanium oxide

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 805 KB

english, 2008

22

Light depolarization induced by sharp metallic tips and effects on Tip-Enhanced Raman Spectroscopy

P.G. Gucciardi, F. Bonaccorso, M. Lopes, L. Billot, M. Lamy de la Chapelle

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 947 KB

english, 2008

23

In-situ and real-time protein adsorption study by Spectroscopic Ellipsometry

S. Lousinian, S. Logothetidis

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 2.25 MB

english, 2008

24

Polychromatic X-ray micro- and nanodiffraction for spatially-resolved structural studies

J.D. Budai, W. Liu, J.Z. Tischler, Z.W. Pan, D.P. Norton, B.C. Larson, W. Yang, G.E. Ice

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 2.09 MB

english, 2008

25

Influence of Nd dopants on lattice parameters and thermal and elastic properties in YVO4 single crystals

J. Kucytowski, K. Wokulska, A. Kazmierczak-Balata, J. Bodzenta, T. Lukasiewicz, B. Hofman, M. Pyka

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 632 KB

english, 2008

26

Comparative ellipsometric and ion beam analytical studies on ion beam crystallized silicon implanted with Zn and Pb ions

Tivadar Lohner, Christo Angelov, Valdek Mikli

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 430 KB

english, 2008

27

Influence of crystallographic orientation on local strains in silicon: A combined high-resolution X-ray diffraction and finite element modelling investigation

M. Eberlein, S. Escoubas, M. Gailhanou, O. Thomas, P. Rohr, R. Coppard

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 2.55 MB

english, 2008

28

Combination of the optical waveguide lightmode spectroscopy method with electrochemical measurements

I. Szendrő, K. Erdélyi, M. Fábián, Zs. Puskás, N. Adányi, K. Somogyi

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 924 KB

english, 2008

29

Surface scattering optical loss measurements in thin oxide planar waveguide layers

I. Szendrő, Zs. Puskás, K. Somogyi, K. Erdélyi

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 951 KB

english, 2008

30

Optimization of metallic X-ray capillary production

R. Mroczka, P. Bartosik, Z. Sawłowicz, K. Skrzypiec, G. Falkenberg, J. Wójcik, G. Żukociński, A. Kuczumow

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 1.64 MB

english, 2008

31

Characterization of sputtered and annealed niobium oxide films using spectroscopic ellipsometry, Rutherford backscattering spectrometry and X-ray diffraction

M. Serényi, T. Lohner, P. Petrik, Z. Zolnai, Z.E. Horváth, N.Q. Khánh

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 473 KB

english, 2008

32

Depth profiling Raman spectroscopy of a thin YBa2Cu3O7 − δ film

M. Brǎnescu, C. Naudin, M. Gartner, G. Nemeş

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 768 KB

english, 2008

33

Reconstruction of lattice structure of ion-implanted near-surface regions of Hg1 − XCdXTe epitaxial layers

A.P. Vlasov, O.Yu. Bonchyk, S.G. Kiyak, I.M. Fodchuk, R.M. Zaplitnyy, T. Kazemirskiy, A. Barcz, P.S. Zieba, Z. Swiatek, W. Maziarz

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 1.13 MB

english, 2008

34

Analysis of water condensation in P123 templated 2D hexagonal mesoporous silica films by X-ray reflectivity

Minhao Yan, Sandrine Dourdain, Alain Gibaud

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 1.02 MB

english, 2008

35

Use of Voigt oscillators to characterize microelectronics materials by Infrared Spectroscopic Ellipsometry

Mickael Gilliot, Jean-Philippe Piel

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 504 KB

english, 2008

36

Mid-IR characterization of photonic bands in 2D photonic crystals on silicon

Zdeněk Král, Josep Ferré-Borrull, Trifon Trifonov, Lluis F. Marsal, Angel Rodriguez, Josep Pallarès, Ramon Alcubilla

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 554 KB

english, 2008

37

Derivation of the complex refractive index of ITO and ITON films in the infrared region of the spectrum by the analysis of optical measurements

A. Kondilis, E. Aperathitis, M. Modreanu

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 308 KB

english, 2008

38

Undoped and Al-doped ZnO films with tuned properties grown by pulsed laser deposition

E.L. Papadopoulou, M. Varda, K. Kouroupis-Agalou, M. Androulidaki, E. Chikoidze, P. Galtier, G. Huyberechts, E. Aperathitis

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 442 KB

english, 2008

39

Influence of illumination and decay of electrical resistance of ITO nanoscale layers

K. Somogyi, K. Erdélyi, I. Szendrő

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 469 KB

english, 2008

40

The effect of PLD deposition parameters on the properties of p-SrCu2O2/n-Si diodes

E.L. Papadopoulou, M. Varda, A. Pennos, M. Kaloudis, M. Kayambaki, M. Androulidaki, K. Tsagaraki, Z. Viskadourakis, O. Durand, G. Huyberechts, E. Aperathitis

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 722 KB

english, 2008

41

Structure, composition, morphology and electrical properties of amorphous SiOx (0 

N. Tomozeiu, H.J.H. Rheiter

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 773 KB

english, 2008

42

Effect of multi-layered bottom electrodes on the orientation of strontium-doped lead zirconate titanate thin films

M. Bhaskaran, S. Sriram, D.R.G. Mitchell, K.T. Short, A.S. Holland

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 378 KB

english, 2008

43

Survey of methods to characterize thin absorbing films with Spectroscopic Ellipsometry

James N. Hilfiker, Neha Singh, Tom Tiwald, Diana Convey, Steven M. Smith, Jeffrey H. Baker, Harland G. Tompkins

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 1.35 MB

english, 2008

44

Transparent thin-film transistors with zinc oxide semiconductor fabricated by reactive sputtering using metallic zinc target

Woo-Seok Cheong, Min-Ki Ryu, Jae-heon Shin, Sang-Hee Ko Park, Chi-Sun Hwang

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 2.23 MB

english, 2008

45

Hydroxyapatite films obtained by sol–gel and sputtering

T.F. Stoica, C. Morosanu, A. Slav, T. Stoica, P. Osiceanu, C. Anastasescu, M. Gartner, M. Zaharescu

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 539 KB

english, 2008

46

Topography description of thin films by optical Fourier Transform

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 809 KB

english, 2008

47

Effect of chlorine doping on electrical and optical properties of ZnO thin films

E. Chikoidze, M. Nolan, M. Modreanu, V. Sallet, P. Galtier

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 498 KB

english, 2008

48

Editorial Board

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 446 KB

english, 2008