Electrical Characterization of Metastable Defects Introduced in GaN by Eu-Ion Implantation
Auret, F. Danie, Meyer, Walter E., Diale, M., Janse Van Rensburg, P.J., Song, S.F., Temst, Kristiaan, Vantomme, AndreVolume:
679-680
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.679-680.804
Date:
March, 2011
File:
PDF, 292 KB
english, 2011