Strain Characterization of Hg1-xFexSe-Layers by Electron...

Materials Science Forum 1995 Vol. 196-201

Strain Characterization of Hg1-xFexSe-Layers by Electron Spin Resonance

Hendorfer, G., Jantsch, W., Helzel, W., Li, J.H., Wilamowski, Zbysław, Widmer, T., Schikora, D., Lischka, K.
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Volume:
196-201
Year:
1995
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.196-201.561
File:
PDF, 423 KB
1995
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