Efficient Image Segmentation for Detection of Dislocations...

Materials Science Forum 2011 / 3 Vol. 679-680

Efficient Image Segmentation for Detection of Dislocations in High Resolution Light Microscope Images of SiC Wafers

Karpinski, Harald, Sakwe, Sakwe Aloysius, Fried, Michael, Bänsch, Eberhard, Wellmann, Peter J.
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Volume:
679-680
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.679-680.277
Date:
March, 2011
File:
PDF, 2.64 MB
english, 2011
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