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Ultra Low-Level Ion Implantation Damage Detected by p-n Junctions Biased above Breakdown
Sciacca, E., Lombardo, Salvatore, Patti, D., Sanfillippo, D., Di Franco, C., Ghioni, M., Zappa, F., Rimini, Emanuele, Cova, S.Volume:
82-84
Year:
2002
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.82-84.431
File:
PDF, 505 KB
english, 2002