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Quantitative comparison of image contrast and pattern between experimental and simulated high-resolution transmission electron micrographs
K. Du, K. von Hochmeister, F. PhillippVolume:
107
Year:
2007
Language:
english
Pages:
12
DOI:
10.1016/j.ultramic.2006.08.003
File:
PDF, 1.78 MB
english, 2007