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Volume 107; Issue 4-5
Main
Ultramicroscopy
Volume 107; Issue 4-5
Ultramicroscopy
Volume 107; Issue 4-5
1
Quantitative comparison of image contrast and pattern between experimental and simulated high-resolution transmission electron micrographs
K. Du
,
K. von Hochmeister
,
F. Phillipp
Journal:
Ultramicroscopy
Year:
2007
Language:
english
File:
PDF, 1.78 MB
Your tags:
english, 2007
2
Carbon nanotubes: A promising standard for quantitative evaluation of AFM tip apex geometry
You Wang
,
Xinyong Chen
Journal:
Ultramicroscopy
Year:
2007
Language:
english
File:
PDF, 606 KB
Your tags:
english, 2007
3
Fluorescence imaging and investigations of directly labelled chromosomes using scanning near-field optical microscopy
Richard M. Baylis
,
Shareen H. Doak
,
Mark D. Holton
,
Peter R. Dunstan
Journal:
Ultramicroscopy
Year:
2007
Language:
english
File:
PDF, 399 KB
Your tags:
english, 2007
4
EFTEM assistant: A tool to understand the limitations of EFTEM
S. Lozano-Perez
,
J.M. Titchmarsh
Journal:
Ultramicroscopy
Year:
2007
Language:
english
File:
PDF, 1.44 MB
Your tags:
english, 2007
5
MAC mode atomic force microscopy studies of living samples, ranging from cells to fresh tissue
Guanglu Ge
,
Dong Han
,
Danying Lin
,
Weiguo Chu
,
Yunxu Sun
,
Lei Jiang
,
Wanyun Ma
,
Chen Wang
Journal:
Ultramicroscopy
Year:
2007
Language:
english
File:
PDF, 1.77 MB
Your tags:
english, 2007
6
Design of a microfabricated, two-electrode phase-contrast element suitable for electron microscopy
Rossana Cambie
,
Kenneth H. Downing
,
Dieter Typke
,
Robert M. Glaeser
,
Jian Jin
Journal:
Ultramicroscopy
Year:
2007
Language:
english
File:
PDF, 763 KB
Your tags:
english, 2007
7
A method of combining STEM image with parallel beam diffraction and electron-optical conditions for diffractive imaging
Haifeng He
,
Chris Nelson
Journal:
Ultramicroscopy
Year:
2007
Language:
english
File:
PDF, 313 KB
Your tags:
english, 2007
8
Separation of bulk and surface-losses in low-loss EELS measurements in STEM
K.A. Mkhoyan
,
T. Babinec
,
S.E. Maccagnano
,
E.J. Kirkland
,
J. Silcox
Journal:
Ultramicroscopy
Year:
2007
Language:
english
File:
PDF, 537 KB
Your tags:
english, 2007
9
Practical considerations for high spatial and temporal resolution dynamic transmission electron microscopy
Michael R. Armstrong
,
Ken Boyden
,
Nigel D. Browning
,
Geoffrey H. Campbell
,
Jeffrey D. Colvin
,
William J. DeHope
,
Alan M. Frank
,
David J. Gibson
,
Fred Hartemann
,
Judy S. Kim
,
Wayne E. King
,
Thomas B. L
Journal:
Ultramicroscopy
Year:
2007
Language:
english
File:
PDF, 909 KB
Your tags:
english, 2007
10
Charge defects glowing in the dark
Bin Deng
,
Laurence D. Marks
,
James M. Rondinelli
Journal:
Ultramicroscopy
Year:
2007
Language:
english
File:
PDF, 785 KB
Your tags:
english, 2007
11
An algorithm for refinement of lattice parameters using CBED patterns
A. Morawiec
Journal:
Ultramicroscopy
Year:
2007
Language:
english
File:
PDF, 417 KB
Your tags:
english, 2007
12
A straightforward specimen holder modification for remnant magnetic-field measurement in TEM
J.W. Lau
,
M.A. Schofield
,
Y. Zhu
Journal:
Ultramicroscopy
Year:
2007
Language:
english
File:
PDF, 333 KB
Your tags:
english, 2007
13
Electron imaging with Medipix2 hybrid pixel detector
G. McMullan
,
D.M. Cattermole
,
S. Chen
,
R. Henderson
,
X. Llopart
,
C. Summerfield
,
L. Tlustos
,
A.R. Faruqi
Journal:
Ultramicroscopy
Year:
2007
Language:
english
File:
PDF, 873 KB
Your tags:
english, 2007
14
A complete analysis of the laser beam deflection systems used in cantilever-based systems
L.Y. Beaulieu
,
Michel Godin
,
Olivier Laroche
,
Vincent Tabard-Cossa
,
Peter Grütter
Journal:
Ultramicroscopy
Year:
2007
Language:
english
File:
PDF, 368 KB
Your tags:
english, 2007
15
IFC (Editorial Board)
Journal:
Ultramicroscopy
Year:
2007
Language:
english
File:
PDF, 204 KB
Your tags:
english, 2007
16
Cantilever dynamics and quality factor control in AC mode AFM height measurements
Liwei Chen
,
Xuechun Yu
,
Dan Wang
Journal:
Ultramicroscopy
Year:
2007
Language:
english
File:
PDF, 777 KB
Your tags:
english, 2007
17
A new nano-accuracy AFM system for minimizing Abbe errors and the evaluation of its measuring uncertainty
Dongmin Kim
,
Dong Yeon Lee
,
Dae Gab Gweon
Journal:
Ultramicroscopy
Year:
2007
Language:
english
File:
PDF, 961 KB
Your tags:
english, 2007
18
Effective removal of Ga residue from focused ion beam using a plasma cleaner
Dong-Su Ko
,
Young Min Park
,
Sung-Dae Kim
,
Young-Woon Kim
Journal:
Ultramicroscopy
Year:
2007
Language:
english
File:
PDF, 742 KB
Your tags:
english, 2007
19
Low-voltage cross-sectional EBIC for characterisation of GaN-based light emitting devices
Grigore Moldovan
,
Payam Kazemian
,
Paul R. Edwards
,
Vincent K.S. Ong
,
Oka Kurniawan
,
Colin J. Humphreys
Journal:
Ultramicroscopy
Year:
2007
Language:
english
File:
PDF, 780 KB
Your tags:
english, 2007
20
Many-beam dynamical simulation of electron backscatter diffraction patterns
Aimo Winkelmann
,
Carol Trager-Cowan
,
Francis Sweeney
,
Austin P. Day
,
Peter Parbrook
Journal:
Ultramicroscopy
Year:
2007
Language:
english
File:
PDF, 758 KB
Your tags:
english, 2007
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